WI01 | INVITED TALK |
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W. CAMINATI, P. G. FAVERO, A. MARIS, S. MELANDRI, P. OTTAVIANI, Dipartimento di Chimica "G.Ciamician", Universita' di Bologna, Via Selmi I-40126, Italy.
WI02 |
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KARISSA G. ATTICKS AND ROBERT K. BOHN, Department of Chemistry, University of Connecticut, Storrs, CT 06269-3060.
WI03 |
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R. J. LAVRICH, R. D. SUENRAM, D. F. PLUSQUELLIC, G. T. FRASER, J. T. HOUGEN AND W. J. STEVENS, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, MD 20899; M. J. TUBERGEN, Department of Chemistry, Kent State University, Kent, OH 44242; Y. KAWASHIMA, Department of Applied Chemistry, Kanagawa Institute of Technology, Atsugi, Kanagawa 243-0292, Japan; EIZI HIROTA, The Graduate University for Advanced Studies, Hayama, Kanagawa 240-0193, Japan; N. OHASHI, Department of Physics, Faculty of Science, Kanazawa University, Kakuma, Kanazawa, Japan 920-1192.
WI04 |
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R. J. LAVRICH, D. F. PLUSQUELLIC, R. D. SUENRAM, G. T. FRASER AND W. J. STEVENS, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, MD 20899; M. J. TUBERGEN, Department of Chemistry, Kent State University, Kent, OH 44242.
WI05 |
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I. KLEINER, CNRS, Laboratoire de Photophysique Moléculaire, Université Paris Sud, 91405 Orsay Cedex, France.; J. T. HOUGEN, R. D. SUENRAM, D. F. PLUSQUELLIC, R. J. LAVRICH, A. R. HIGHT WALKER, F. J. LOVAS, G. T. FRASER, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, MD. 20899, USA.; J. ORTIGOSO, Instituto de Estructura de la Materia, CSIC, Serrano 119, Madrid, Spain.
WI06 |
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YOSHIYUKI KAWASHIMA, TSUYOSHI USAMI, Department of Applied Chemistry, Kanagawa Institute of Technology, Atsugi, Kanagawa 243-0292, JAPAN; RICHARD D. SUENRAM, National Institute of Standards and Technology, Gaithersburg, MD 20899; AND EIZI HIROTA, The Graduate University for Advanced Studies, Hayama, Kanagawa 240-0193, JAPAN.
WI07 |
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YOSHIYUKI KAWASHIMA, Department of Applied Chemistry, Kanagawa Institute of Technology, Atsugi, Kanagawa 243-0292, JAPAN; RICHARD D. SUENRAM, National Institute of Standards and Technology, Gaithersburg, MD 20899; AND EIZI HIROTA, The Graduate University for Advanced Studies, Hayama, Kanagawa 240-0193, JAPAN.
WI08 |
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N. OHASHI, Department of Physics, Faculty of Science, Kanazawa University, Kakuma, Kanazawa, Japan 920-1192; J. PYKA, Faculty of Chemistry, Adam Mickiewicz University, Poznan´, Poland; G. YU. GOLUBIATNIKOV, Institute of Applied Physics, Russian Academy of Sciences, Uljanov Street 46, 603600 Nizhnii Novgorod, Russia; J. T. HOUGEN, R. D. SUENRAM, F. J. LOVAS, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, MD. 20899, USA; A. LESARRI, Departamento de Quimica-Fisica, Facultad de Ciencias, Universidad de Valladolid, 47005, Valladolid, Spain; Y. KAWASHIMA, Department of Applied Chemistry, Kanagawa Institute of Technology, 1030 Shimo-ogino, Atsugi, Kanagawa, Japan 243-0292.
WI09 |
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J. P. I. HEARN AND B. J. HOWARD, Physical and Theoretical Chemistry, South Parks Road, Oxford, OX1 3QZ, UK..
WI10 |
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R. J. LAVRICH, D. F. PLUSQUELLIC, T. PETRALLI-MALLOW, T. M. KORTER, S. R. DAVIS AND R. D. SUENRAM, Optical Technology Division, National Institute of Technology, Gaithersburg, MD 20899.