Condensed Matter

    Park Scientific Instruments AFM & STM -
    controls and electronics

CM 04: The Atomic Force Microscope

Learn about scanning probe microscopy, a widely used technique in condensed matter physics. You will use the apparatus in its atomic force mode to study the structure of mica and graphite. You may also study other materials, such as samples from the crystal growth experiment, or you may use the scanning tunneling mode of the apparatus.